Author: ~ 1 title(s) available
Introduction to Scanning Probe Microscopy Unit, Topic: Atomic Force Microscopy & Scanning Tunneling Microscopy
Submitted on 02-MAY-06
Contributed by Lincoln Lauhon
This module will familiarize students with cutting-edge surface analysis techniques that are important in academic and industrial settings. The focus of the module is on scanned probed techniques that probe the nanoscale electrical and mechanical properties of surfaces, including scanning tunneling microscopy and atomic force microscopy. Principles of nanoscale imaging and modes of operation of scanning probe microscopy will be reviewed. ...
