Introduction to Scanning Probe Microscopy Unit

Topic: Atomic Force Microscopy & Scanning Tunneling Microscopy

This module will familiarize students with cutting-edge surface analysis techniques that are important in academic and industrial settings. The focus of the module is on scanned probed techniques that probe the nanoscale electrical and mechanical properties of surfaces, including scanning tunneling microscopy and atomic force microscopy. Principles of nanoscale imaging and modes of operation of scanning probe microscopy will be reviewed.

• Learning Objectives for Scanning Probe Microscopy (pdf)
• Notes (pdf)

Atomic Force Microscopy  Lecture Videos (Real Movie) High (LAN/T1-Campus) | Low (DSL/Cable-Home)
	Principles of AFM   High  |  Low Nanonewton force detection with small spring-constant cantilever, detection of nanometer scale displacements with laser and split photodiode, motion of AFM tip and sample when scanning.
	Imaging Modes   High  |  Low Contact mode, lateral force mode, tapping mode, effect of tip-sample interaction on cantilever resonance/effective spring constant, “lift mode” imaging.
	Force Gradient Detection   High  |  Low Phase imaging of force gradients, magnetic and electrostatic force microscopy.
	Mechanical Properties of Surface   High  |  Low Nanoindentation with AFM tip, determination of elastic modulus and yield strength.